The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2015

Filed:

Jun. 07, 2012
Applicants:

Hideki Kawabata, Tokyo, JP;

Akira Kijima, Tokyo, JP;

Inventors:

Hideki Kawabata, Tokyo, JP;

Akira Kijima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); G06T 7/40 (2006.01); G01J 3/50 (2006.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G06T 7/408 (2013.01); G01J 3/50 (2013.01); G01J 3/0291 (2013.01); G01J 3/0278 (2013.01); G01J 3/0264 (2013.01); G01J 3/0289 (2013.01); G01J 3/0208 (2013.01); G01J 3/027 (2013.01);
Abstract

A measurement system is capable of accurately aligning the corresponding measurement points of a plurality of measurement targets to evaluate the measurement targets from measurement results. A measurement system includes a measuring instrument and a PC, the measuring instrument includes a spectroscopic unit that measures a measurement point of a measurement target and a camera that images surroundings in real-time. The PC displays an evaluation image of continuous image information, which is imaged and displayed by the camera on a display screen so as to be superimposed on a reference image of still image information, which has been imaged and stored in memory. By comparing the data obtained by measuring the measurement point in the evaluation image when both images overlap each other and the measurement data of the point in the reference image, it is possible to perform positioning easily and compare the measurement data.


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Kawabata, Hideki. (2015). Measuring instrument, measurement system, measurement position positioning method and measurement position positioning program using the same (U.S. Patent No. 9070204). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9070204

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