The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2015
Filed:
Oct. 25, 2013
Joanne Fredrich, Houston, TX (US);
Elizabeth Liu, Houston, TX (US);
Laurent Louis, Katy, TX (US);
Dianne NI, Katy, TX (US);
Joanne Fredrich, Houston, TX (US);
Elizabeth Liu, Houston, TX (US);
Laurent Louis, Katy, TX (US);
Dianne Ni, Katy, TX (US);
BP Corporation North America Inc., Houston, TX (US);
Abstract
A testing system for analyzing a 3D digital volume of a material sample. The testing system defines several test volume sizes with each test volume size including a different numbers of voxels, defining the size of portions of the 3D digital volume to analyze. For each test volume size, the testing system acquires two adjacent portions of 3D digital volume at the test volume size currently being analyzed. The testing system calculates a material property value for the two adjacent portions of the 3D digital volume, and a difference value between the two adjacent portions of the 3D digital volume. The process is repeated over the different test volume sizes. The testing system calculates mean difference values for the different test volume sizes, from which it determines a representative elementary volume.