The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2015

Filed:

Jan. 11, 2012
Applicants:

Hitoshi Yamada, Osaka, JP;

Sheng Mei Shen, Singapore, SG;

BO LI, Singapore, SG;

Chin Phek Ong, Singapore, SG;

Inventors:

Hitoshi Yamada, Osaka, JP;

Sheng Mei Shen, Singapore, SG;

Bo Li, Singapore, SG;

Chin Phek Ong, Singapore, SG;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4642 (2013.01); G06K 9/4671 (2013.01); G06T 7/0028 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/20021 (2013.01);
Abstract

To enhance the accuracy of image alignment performed to reduce a vertical disparity between a first image and a second image that are images of the same object captured from different viewpoints, an image processing apparatus according to an aspect of the present invention includes: a division unit which divides each of the first image and the second image into a plurality of sub-regions; and an extraction unit which performs feature point extraction on each of the sub-regions, wherein the extraction unit performs the feature point extraction in such a manner that a value indicating a degree of variation among the sub-regions in total number of extracted feature points is less than or equal to a predetermined value.


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