The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2015

Filed:

Oct. 11, 2013
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Leiming Su, Tokyo, JP;

Yukio Hoshino, Kanagawa, JP;

Yukio Itakura, Kanagawa, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 5/117 (2006.01); G07C 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/0061 (2013.01); A61B 5/117 (2013.01); G06K 9/00617 (2013.01); G07C 9/00158 (2013.01);
Abstract

A plurality of pieces of information related to the iris pattern of an eye can be checked against each other in a short time. Characteristic curves (S()-S()), which are in accordance with eight ring areas (A-A) formed by dividing an image of an iris, are generated. The polarities of the gradients of these characteristic curves are then arranged, thereby generating codes (-) to be checked. Each of these codes (-) to be checked consists of a ternary combination of +, − and zero, whereby the amount of data to be handled during the checking process can be reduced. As a result, checking the codes to be checked can be performed in a short time.


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