The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2015
Filed:
May. 10, 2013
International Business Machines Corporation, Armonk, NY (US);
Manabu Hanzaike, Bunkyo-ku, JP;
Yuhichi Ishikawa, Matsudo, JP;
Fumihiko Kitayama, Kanagawa-ken, JP;
Yoshihiko Kumabayashi, Kiyota-Sapporo, JP;
Motoichi Ohya, Kanagawa-pre., JP;
Yuhji Ohyama, Kanagawa, JP;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and associated systems for reducing false-positive errors in a software change-impact analysis of a basepoint variable. A processor of a computer system identifies a first generation of change-affected parts of one or more computer programs, where each identified part is affected by a change to the basepoint variable. The processor confirms the identification of each identified part by analyzing one or more characteristics of the basepoint variable and of the identified part. If the processor confirms that an identification is the product of a false-positive error, the falsely identified part is discarded. The processor then identifies a second generation of confirmed change-affected parts by repeating the procedure performed on the basepoint variable on each confirmed part of the first generation of parts. The processor continues this iterative process through additional generations until it identifies a generation that contains no confirmed change-affected parts.