The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2015

Filed:

Apr. 09, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Edward A. Addison, Raleigh, NC (US);

Peggy A. DeVal, Raleigh, NC (US);

Philip R. Lee, Winchester, GB;

Andrew Wright, Eastleigh, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3428 (2013.01); G06F 11/3476 (2013.01); G06F 2201/87 (2013.01); G06F 11/0709 (2013.01); G06F 11/079 (2013.01);
Abstract

Performance data for a healthy system is captured and used to create benchmarks that represent behavior of the computing environment in a healthy state. Current behavior (e.g, run-time characteristics) of the computing environment are monitored in an on-going manner, and are compared to the benchmarks. When a benchmark is violated, performance data capture is dynamically and automatically enabled. Or, if performance data is already being captured, then performance data capture may be enabled for a larger subset of possible data. Optionally, performance data capture may be automatically disabled upon detecting that the current behavior of the computing environment has returned to a healthy state where benchmarks are no longer violated.


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