The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2015
Filed:
Mar. 16, 2012
Samuel T. Trim, Sammanish, WA (US);
Brad Snow, Duvall, WA (US);
Samuel T. Trim, Sammanish, WA (US);
Brad Snow, Duvall, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
Various embodiments pertain to techniques for predicting and isolating patterns or trends across datasets. In various embodiments, one or more Q-entities are extracted from a data seed, associated with one or more dimensions, and classified into one or more clusters for each dimension with which it is associated. In some embodiments, a Q-entity can exist in more than one dimension and/or more than one cluster within a dimension. Once information from the data seed is associated with a dimension and cluster, frequency analysis can be utilized to ascertain a pattern or trend in the data. In various embodiments, additional data can be processed, added to the dimensions and clusters, and frequency analysis can be performed on the updated dataset to provide additional information on the pattern or trend.