The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2015

Filed:

Mar. 11, 2010
Applicant:

Robert Carter Moore, Mercer Island, WA (US);

Inventor:

Robert Carter Moore, Mercer Island, WA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/27 (2006.01); G06F 17/28 (2006.01); G10L 15/00 (2013.01); G10L 15/18 (2013.01); G10L 15/197 (2013.01);
U.S. Cl.
CPC ...
G06F 17/2775 (2013.01); G06F 17/2715 (2013.01); G06F 17/2881 (2013.01); G10L 15/197 (2013.01);
Abstract

Described is a technology by which a probability is estimated for a token in a sequence of tokens based upon a number of zero or more times (actual counts) that the sequence was observed in training data. The token may be a word in a word sequence, and the estimated probability may be used in a statistical language model. A discount parameter is set independently of interpolation parameters. If the sequence was observed at least once in the training data, a discount probability and an interpolation probability are computed and summed to provide the estimated probability. If the sequence was not observed, the probability is estimated by computing a backoff probability. Also described are various ways to obtain the discount parameter and interpolation parameters.


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