The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2015
Filed:
Apr. 15, 2011
Chun Sing Jackson Chung, Sunnyvale, CA (US);
Steven Shisan Cheng, Sunnyvale, CA (US);
Chun Sing Jackson Chung, Sunnyvale, CA (US);
Steven Shisan Cheng, Sunnyvale, CA (US);
SanDisk Technologies Inc., Plano, TX (US);
Abstract
Techniques are presented for dynamically optimizing the performance of the controller-memory (or 'back-end') interface of a non-volatile memory system. Memory systems are usually designed to have a certain amount of error tolerance for error that can then be corrected by ECC. In may circumstances, such as when a device is new, the ECC capabilities of the system exceed what is needed to correct data storage errors. In these circumstances the memory system internally allots a non-zero portion of this error correction capacity to the back-end interface. This allows for the interface to operate at, for example, higher speed or lower power, even though this will likely lead to transmission path error. The system can also calibrate the back-end interface to determine that amount of error that result from various operating conditions, allowing the operating parameters of the back-end interface to be set according to amount of error that is allotted to the transfer process.