The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2015

Filed:

Apr. 09, 2012
Applicants:

Douglas J. Koebler, Irwin, PA (US);

Alfred Blalock Bahnson, Pittsburgh, PA (US);

Inventors:

Douglas J. Koebler, Irwin, PA (US);

Alfred Blalock Bahnson, Pittsburgh, PA (US);

Assignee:

Kairos Instruments, LLC, Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/14 (2006.01);
U.S. Cl.
CPC ...
G02B 21/14 (2013.01);
Abstract

An optical microscope is provided with an adjustable optical phase ring. The adjustable ring provides a way to compensate for distortion in the visible phase ring before the light reaches the sample. In an inverted microscope, when observing transparent cells under a liquid, the visible light phase ring is distorted. By the use of a Liquid Crystal Display (LCD) in place of a fixed ring, the projected ring is adjusted to realign the light and produce phase. In a typical micro plate, the meniscus formed produces a lens effect that is realigned by providing changes in the position and pattern, to allow phase imaging over a wider portion of the well. The realignment of the ring can be manual or automated and can be dynamically adjusted based upon an observed image of the sample.


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