The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2015

Filed:

Oct. 17, 2013
Applicant:

Olympus Corporation, Shibuya-ku, Tokyo, JP;

Inventor:

Daisuke Nishiwaki, Hino, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01); G02B 26/0833 (2013.01);
Abstract

A illumination apparatus for microscope comprises a light source, a spatial modulation section, a first illumination optical system, a second illumination optical system, and the spatial modulation section includes a spatial modulation element which is of reflecting type, and a polarizing element, and the first illumination optical system is disposed in an optical path from the light source up to the spatial modulation element, and the second illumination optical system is disposed in an optical path from the spatial modulation element up to a specimen position, and a position of the spatial modulation element is conjugate with the specimen position. Moreover, a microscope comprises a illumination apparatus, a main-body section, an observation unit, and a control unit, and the illumination apparatus for microscope is to be used as the illumination apparatus.


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