The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2015
Filed:
Jan. 26, 2012
Qishan Yu, San Diego, CA (US);
Jeffrey M. Thoma, Cupertino, CA (US);
Robert S. Sorensen, Fremont, CA (US);
Qishan Yu, San Diego, CA (US);
Jeffrey M. Thoma, Cupertino, CA (US);
Robert S. Sorensen, Fremont, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
A device under test (DUT) may be tested using a radio-frequency test station. The DUT may include at least one antenna, wireless communications circuitry associated with the antenna, and other peripheral components such as a camera module, a display module, and audio circuitry. The test station may include a shielded enclosure in which the DUT is placed during testing. The DUT need not be electrically wired to any test equipment. The DUT may be configured to operate in self test mode. The DUT may be configured to obtain baseline noise floor measurements while all the peripheral components are deactivated and may be configured to obtain elevated noise floor measurements while selectively activating desired subsets of the peripheral components. The difference between the elevated and baseline noise floor measurements may be computed to determine whether at least some of the peripheral components negatively impact the antenna performance by an excessive amount.