The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2015
Filed:
Jul. 31, 2012
Kazuya Fukuda, Kobe, JP;
Hiroki Koike, Kobe, JP;
Hironori Katsumi, Kobe, JP;
Takashi Yamato, Kakogawa, JP;
Masayuki Ikeda, Kobe, JP;
Tsuyoshi Fukuzaki, Akashi, JP;
Daisuke Nakano, Kobe, JP;
Masanori Imazu, Takasago, JE;
Nobuhiro Kitagawa, Akashi, JP;
Kazuya Fukuda, Kobe, JP;
Hiroki Koike, Kobe, JP;
Hironori Katsumi, Kobe, JP;
Takashi Yamato, Kakogawa, JP;
Masayuki Ikeda, Kobe, JP;
Tsuyoshi Fukuzaki, Akashi, JP;
Daisuke Nakano, Kobe, JP;
Masanori Imazu, Takasago, JE;
Nobuhiro Kitagawa, Akashi, JP;
SYSMEX CORPORATION, Hyogo, JP;
Abstract
A specimen analyzing apparatus comprising: a detector for detecting component information regarding a component in a specimen contained in each of analyzing containers, the analyzing containers comprising first and second analyzing containers; an analyzing part for analyzing the component information detected by the detector; a transporting device for transporting specimen containers each containing a specimen, the specimen containers comprising first and second specimen containers; an operation mode selector for selecting one of a first operation mode and a second operation mode; a first supplying device for supplying the specimen of a first amount; a second supplying device for supplying the specimen of a second amount greater than the first amount; and a supply controller for controlling the first and second supplying devices in accordance with an operation mode selected by the operation mode selector, is disclosed. A specimen analyzing method is also disclosed.