The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2015
Filed:
Feb. 03, 2014
Purdue Research Foundation, West Lafayette, IN (US);
Ji-Xin Cheng, West Lafayette, IN (US);
Mikhail N. Slipchenko, West Lafayette, IN (US);
Robert A. Oglesbee, West Lafayette, IN (US);
Purdue Research Foundation, West Lafayette, IN (US);
Abstract
A system for measuring an sample includes an illumination source providing electromagnetic radiation pulses at a selected temporal frequency. A microscope focuses the radiation to interact with the sample and produce resultant electromagnetic radiation. A disperser disperses wavelengths of the resultant radiation onto optical sensors, and respective resonant amplifiers amplify signals having the selected temporal frequency. Optical detection apparatus includes the optical sensors, resonant amplifiers, and disperser. The resonant amplifiers amplify portion(s) of their inputs having a selected temporal frequency and attenuate other portion(s). A method of analyzing constituents of a sample includes contemporaneously irradiating the sample with narrowband light and broadband light, the optical power of either modulated at a selected temporal frequency; dispersing wavelengths of resultant light across the optical detectors; and filtering respective signals from the optical detectors to provide spectrum data including signals corresponding to the selected temporal frequency.