The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2015
Filed:
May. 31, 2012
Naoki Hikage, Tokyo, JP;
Masataka Matsuo, Tokyo, JP;
Takatoshi Kaya, Tokyo, JP;
KONICA MINOLTA, INC., , JP;
Abstract
To provide a surface plasmon-field enhanced fluorescence spectroscopic measurement method and a surface plasmon-field enhanced fluorescence spectroscopic measurement device which are capable of accurately measuring a fluorescent signal regardless of the type of a light detection means even when the concentration of an analyte is high by adjusting the dynamic range of the SPFS device. A surface plasmon-field enhanced fluorescence stereoscopic measurement method wherein an analyte labeled with a fluorescent substance is excited by surface plasmon light generated by applying excitation light to a metallic thin film, and generated fluorescence is received by a light detection means to thereby detect the analyte. The dynamic range is expanded by adjusting the amount of the fluorescence received by the light detection means.