The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2015

Filed:

Apr. 27, 2011
Applicants:

Dmitriy V. Ivashin, Peabody, MA (US);

Saïd Boumsellek, San Diego, CA (US);

Inventors:

Dmitriy V. Ivashin, Peabody, MA (US);

Saïd Boumsellek, San Diego, CA (US);

Assignee:

Implant Sciences Corporation, Wilmington, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01); G01N 27/62 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
G01N 27/626 (2013.01); H01J 49/0036 (2013.01);
Abstract

Using combined orthogonal techniques, such as low (IMS) and high (FAIMS) field mobility techniques, offers several advantages to ion detection and analysis techniques including low cost, no vacuum required, and the generation of 2-D spectra for enhanced detection and identification. Two analytical devices may be operated in different modes, which results in overall flexibility by adapting the hyphenated instrument to the application's requirements. With the IMS-FAIMS hardware level flexibility, the instruments may be configured and optimized to exploit different trade-offs suitable for a variety of detection scenarios of for different lists of target compounds.


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