The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2015

Filed:

Dec. 21, 2012
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Susanne Madeline Lee, Cohoes, NY (US);

Sudeep Mandal, Niskayuna, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01); G21K 1/06 (2006.01); G01N 23/207 (2006.01); H01J 35/08 (2006.01); H01J 35/14 (2006.01); H01J 35/12 (2006.01);
U.S. Cl.
CPC ...
G01N 23/207 (2013.01); G21K 1/06 (2013.01); H01J 35/08 (2013.01); H01J 35/12 (2013.01); H01J 35/14 (2013.01); G21K 2207/005 (2013.01); H01J 2235/086 (2013.01); H01J 2235/186 (2013.01);
Abstract

Embodiments of the disclosure relate to X-ray imaging systems. In one embodiment, the X-ray imaging system features a target configured to receive a focused electron beam from an electron emitter and emit a line source X-ray beam as a result of receiving the focused electron beam; and a monochromator crystal configured to receive the line source X-ray beam from the target and diffract only a portion of the X-rays, wherein the portion of X-rays satisfies the Bragg diffraction condition for the monochromator crystal, and wherein the monochromator crystal is oriented relative to the target such that the portion of the X-rays from the target that satisfy the Bragg condition illuminate an entire length of a surface of the monochromator crystal.


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