The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2015

Filed:

Aug. 18, 2014
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Kenji Goto, Nagano, JP;

Hideaki Yamada, Shimosuwa-machi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01); G01B 11/26 (2006.01); G01N 21/21 (2006.01); G01N 33/02 (2006.01); G01N 33/14 (2006.01);
U.S. Cl.
CPC ...
G01B 11/26 (2013.01); G01J 4/00 (2013.01); G01N 21/21 (2013.01); G01N 33/025 (2013.01); G01N 33/143 (2013.01);
Abstract

In a first optical measurement device, light which is output from a light source is subject to linear polarizing in a polarizing unit, and is input to a test object A. Transmitted light which has passed through the test object A is orthogonally separated in an orthogonal separation unit, and the light which is orthogonally separated in the orthogonal separation. unit is received in two light receiving units. In addition, amount of light of the transmitted light is determined by a control unit, and a difference between received light levels which are received in the light receiving unit is normalized using the amount of light which is determined in a transmitted amount of light determination unit, and then the angle of optical rotation is calculated by the angle of optical rotation calculation unit.


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