The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2015
Filed:
Sep. 14, 2012
Applicant:
Richard S. Johnston, Sammamish, WA (US);
Inventor:
Richard S. Johnston, Sammamish, WA (US);
Assignee:
University of Washington, Seattle, WA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); A61B 1/00 (2006.01); G06K 9/20 (2006.01); G06K 9/30 (2006.01); G06T 7/00 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 1/00057 (2013.01); A61B 1/00096 (2013.01); A61B 1/00172 (2013.01); A61B 5/0062 (2013.01); G06K 9/209 (2013.01); G06K 9/30 (2013.01); G06T 7/0018 (2013.01); G06T 2207/10068 (2013.01);
Abstract
Scanning beam device calibration using a calibration pattern is disclosed. In one aspect, a method may include acquiring an image of a calibration pattern using a scanning beam device. The acquired image may be compared with a representation of the calibration pattern. The scanning beam device may be calibrated based on the comparison. Software and apparatus to perform these and other calibration methods are also disclosed.