The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2015
Filed:
Dec. 03, 2010
Ewald Roessl, Ellerau, DE;
Klaus Juergen Engel, Aachen, DE;
Gereon Vogtmeier, Aachen, DE;
Dieter Geller, Aachen, DE;
Gerhard Martens, Henstedt-Ulzburg, DE;
Sebastian Siegmund Schusser, Aachen, DE;
Thomas Koehler, Norderstedt, DE;
Ewald Roessl, Ellerau, DE;
Klaus Juergen Engel, Aachen, DE;
Gereon Vogtmeier, Aachen, DE;
Dieter Geller, Aachen, DE;
Gerhard Martens, Henstedt-Ulzburg, DE;
Sebastian Siegmund Schusser, Aachen, DE;
Thomas Koehler, Norderstedt, DE;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
An X-ray image acquisition apparatus employing phase-contrast imaging with enlarged field of view includes an X-ray source, an X-ray detector element having a detector size, a beam splitter grating and an analyzer grating. An object is arrangeable between the X-ray source and detector. The beam splitter grating and the analyzer grating are arrangeable between the X-ray source and detector. The X-ray source, the beam splitter grating, the analyzer grating and the X-ray detector are operatively coupled such that a phase-contrast image of the object is obtainable. The apparatus is configure to acquire a phase-contrast image having a field of view larger than the detector size. The X-ray detector element is displaceable where, by the displacement of the X-ray detector, a phase-contrast image of the enlarged field of view is obtainable.