The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2015

Filed:

Apr. 12, 2012
Applicants:

Wen Xu, Neubiberg, DE;

Xiaojun MA, Munich, DE;

Inventors:

Wen Xu, Neubiberg, DE;

Xiaojun Ma, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 36/24 (2009.01); H04W 24/08 (2009.01); H04W 48/16 (2009.01); H04W 48/12 (2009.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04W 48/16 (2013.01); H04W 48/12 (2013.01);
Abstract

Some aspects of the present disclosure relate to a method for accurately detecting and measuring signals received from multiple cells surrounding a user equipment (UE) during a cell search. The method is performed by receiving a composite signal comprising an aggregate of transmissions (e.g., synchronization signals) from a plurality of base stations at a UE. A correlation-based metric describing a cell is generated by performing a cross-correlation of a transmission (e.g., synchronization signal, reference signal, etc.) from the cell with the received composite signal. The correlation-based metric of weaker cells may be modified to generate an equivalent ideal metric, also proportional to the search criteria, in which the impact of interfering signals is suppressed. By suppressing the impact of the interfering signals, the equivalent ideal metric can be used to identify a weaker target signal in light of the eclipsing, stronger signals.


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