The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2015
Filed:
Mar. 08, 2013
Tadashi Kitai, Kanagawa, JP;
Hitomi Kaneko, Saitama, JP;
Hiroyoshi Ishizaki, Kanagawa, JP;
Keiji Kojima, Kanagawa, JP;
Hiroyuki Kawamoto, Kanagawa, JP;
Keiichi Miyamoto, Kanagawa, JP;
Tadashi Kitai, Kanagawa, JP;
Hitomi Kaneko, Saitama, JP;
Hiroyoshi Ishizaki, Kanagawa, JP;
Keiji Kojima, Kanagawa, JP;
Hiroyuki Kawamoto, Kanagawa, JP;
Keiichi Miyamoto, Kanagawa, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
An apparatus, system, method, and a non-transitory recording medium storing an image inspection control program, each of which is capable of inspecting a printed image based on comparison between a read image read from the printed image and an inspection image. As a portion of the read image is obtained, the size of the obtained portion of the read image is corrected to match the size of the inspection image, using a magnification ratio previously obtained. After matching the sizes of the read image and the inspection image, the read image is compared with the inspection image to inspect the read image.