The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2015
Filed:
Mar. 03, 2011
Isao Shimokawa, Mitaka, JP;
Toshiaki Tarui, Sagamihara, JP;
Hiroki Miyamoto, Fujisawa, JP;
Tomohiro Baba, Tachikawa, JP;
Isao Shimokawa, Mitaka, JP;
Toshiaki Tarui, Sagamihara, JP;
Hiroki Miyamoto, Fujisawa, JP;
Tomohiro Baba, Tachikawa, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
Systems, methods and devices for failure analysis are provided. Using aggregation flow mining (AFM) or a similar method, an integrated mining of flow (IMF) acquires, from each router to be tested, information relating to each flow. The IMF, in relation to each of the routers, obtains distributions of statistical information such as throughput or difference for each flow; calculates, in relation to each of the distributions, a Mahalanobis distance in relation to the expected value of a reference distribution; and makes a comprehensive assessment of the distributions to perform a fault determination. When the fault determination is performed, a normal value of the distribution used for comparison is acquired from AFM and updated through feedback as needed. After the results of fault determination relating to other routers are assessed, the expected value of the standard deviation and the average value of the reference distribution used for comparison are updated.