The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2015

Filed:

Sep. 12, 2012
Applicants:

Hideyuki Koinuma, Yokohama, JP;

Go Sugizaki, Machida, JP;

Toshikazu Ueki, Yokohama, JP;

Inventors:

Hideyuki Koinuma, Yokohama, JP;

Go Sugizaki, Machida, JP;

Toshikazu Ueki, Yokohama, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 29/14 (2006.01);
U.S. Cl.
CPC ...
H04L 29/14 (2013.01);
Abstract

An abnormality detection unit provided in at least one node among a plurality of nodes included in an information processing apparatus detects abnormality in a data transmission path of data transmission using a shared memory area sharable in a single node and other node, which is included in the storage unit provided in the single node or other nodes. An error information generation unit provided in the single node generates error information, based on the abnormality detected by the abnormality detection unit, and generates an interrupt with respect to a processor within a self node. The processor provided in the single node performs recovery processing, based on the error information according to the interrupt.


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