The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2015

Filed:

Aug. 31, 2011
Applicants:

Léa Di Cioccio, Saint Ismier, FR;

Laurent Vandroux, Le Cheylas, FR;

Inventors:

Léa Di Cioccio, Saint Ismier, FR;

Laurent Vandroux, Le Cheylas, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/30 (2006.01); H01L 21/50 (2006.01); H01L 21/02 (2006.01); H01L 21/20 (2006.01); H01L 21/762 (2006.01);
U.S. Cl.
CPC ...
H01L 21/50 (2013.01); H01L 21/02332 (2013.01); H01L 21/0234 (2013.01); H01L 21/2007 (2013.01); H01L 21/76251 (2013.01);
Abstract

To avoid problems of hydrolysis of the silicon oxide formed by PECVD at the surface of at least one wafer, it is proposed to cover, in the vacuum deposition chamber used to deposit the silicon oxide, said oxide with a temporary protective layer containing nitrogen. The protective layer thus protects the silicon oxide against the outer environment and especially against humidity when the wafer provided with the silicon oxide is stored outside of the vacuum deposition chamber. Afterwards, the protective layer is removed, for example, by chemical-mechanical. polishing, just before the two wafers are placed into contact. The protective layer may be formed by a PECVD silicon nitride deposition, by plasma nitriding or nitrogen doping of a superficial portion of the silicon oxide.


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