The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2015

Filed:

Jun. 14, 2013
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventor:

Masafumi Hamaguchi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/40 (2006.01); H01L 29/417 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
H01L 29/41775 (2013.01); H01L 29/401 (2013.01);
Abstract

A semiconductor device includes a substrate, and a gate electrode formed on the substrate on a gate insulation film. The semiconductor device also includes a source diffusion layer and a drain diffusion layer which are formed on the substrate where the gate electrode is sandwiched between the source diffusion layer and the drain diffusion layer, one or more source contacts formed on the source diffusion layer; and one or more drain contacts formed on the drain diffusion layer. At least one of the source contacts and the drain contacts includes a first contact region having a first size and a second contact region having a second size larger than the first size on the same source diffusion layer or on the same drain diffusion layer.


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