The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2015

Filed:

Aug. 16, 2011
Applicants:

Hideki Yasuhara, Kawasaki, JP;

Akira Bandoh, Chichibu, JP;

Inventors:

Hideki Yasuhara, Kawasaki, JP;

Akira Bandoh, Chichibu, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/20 (2006.01); H01L 21/02 (2006.01); C23C 16/458 (2006.01); C30B 25/12 (2006.01); H01L 21/687 (2006.01); C30B 25/02 (2006.01); C30B 29/40 (2006.01); H01L 33/00 (2010.01);
U.S. Cl.
CPC ...
H01L 21/02293 (2013.01); C23C 16/4583 (2013.01); C30B 25/12 (2013.01); H01L 21/0237 (2013.01); H01L 21/0242 (2013.01); H01L 21/02458 (2013.01); H01L 21/0254 (2013.01); H01L 21/02573 (2013.01); H01L 21/0262 (2013.01); H01L 21/6875 (2013.01); H01L 21/68757 (2013.01); H01L 21/68764 (2013.01); H01L 21/68771 (2013.01); H01L 33/007 (2013.01); C30B 25/02 (2013.01); C30B 29/403 (2013.01);
Abstract

Provided is an apparatus for manufacturing a compound semiconductor, which forms a compound semiconductor layer using a metal-organic chemical vapor deposition method. The apparatus is characterized in that: the apparatus is provided with a reaction container, a holder, which is disposed in the reaction container and has placed thereon a subject, on which the layer is to be formed, the subject having facing up the subject surface where the layer is to be formed, and a raw material supply port, through which the raw material gas of the compound semiconductor is supplied to the inside of the reaction container from the outside; the holder is in contact with the lower surface of the subject, the contact being inside of the outer circumferential portion of the subject to the center of the upper surface of the holder; and that the holder has a supporting portion, which supports the subject such that a predetermined interval is maintained between the upper surface of the holder and the lower surface of the subject. In the manufacture of the compound semiconductor using the MOCVD method, temperature distribution on the substrate surface to be deposited with a compound semiconductor crystal, and deviation of in-plane averaged light emission wavelength from a target value are suppressed using the apparatus.


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