The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2015
Filed:
Mar. 18, 2013
Applicant:
General Electric Company, Schenectady, NY (US);
Inventors:
Kevin Bernard Kenny, Niskayuna, NY (US);
Megan Pearl Rothney, Saratoga Springs, NY (US);
Assignee:
General Electric Company, Niskayuna, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 7/0036 (2013.01); G06T 2200/32 (2013.01); G06T 2207/30024 (2013.01); G06T 2207/30072 (2013.01);
Abstract
Automated assessment of registration quality, focus, and area defects in sequentially acquired images, such as images acquired by a digital microscope, is disclosed. In one embodiment, acquired images are registered and whole-image defects are automatically detected based on a figure of merit generated by the registration process. In related implementations, area defects may be automatically detected by calculating correlations in localized image regions for images acquired in different imaging rounds.