The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2015
Filed:
Sep. 05, 2013
Hitomi Kaneko, Saitama, JP;
Tadashi Kitai, Kanagawa, JP;
Hitomi Kaneko, Saitama, JP;
Tadashi Kitai, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An image inspection apparatus for inspecting a scanned image of an output image includes an inspection reference image generator to generate an inspection reference image; an image inspection unit to determine a defect by comparing a difference between the inspection reference image and the scanned image with a threshold; a threshold determiner to determine the threshold; and a defect range determiner to determine a range of defect level of a plurality of artificial defects. Based on a difference computed for a defect selected from the plurality of artificial defects, the threshold determiner determines a threshold to be compared with the difference of the selected defect. The defect range determiner conducts a defect determination for the scanned image at the upper and lower limits for a threshold to determine a range of defect level of the plurality of artificial defects.