The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2015

Filed:

Mar. 12, 2013
Applicant:

Renesas Electronics Corporation, Kawasaki-shi, Kanagawa, JP;

Inventors:

Hiromichi Yamada, Hitachi, JP;

Nobuyasu Kanekawa, Hitachi, JP;

Tsutomu Yamada, Hitachinaka, JP;

Kesami Hagiwara, Kanagawa, JP;

Assignee:

Renesas Electronics Corporation, Kawasaki-shi, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/20 (2006.01); G06F 9/48 (2006.01); G06F 11/14 (2006.01); G06F 21/56 (2013.01); G06F 11/16 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2041 (2013.01); G06F 9/4881 (2013.01); G06F 11/1497 (2013.01); G06F 11/1492 (2013.01); G06F 21/566 (2013.01); G06F 11/1641 (2013.01); G06F 11/1691 (2013.01);
Abstract

The present invention provides a semiconductor integrated circuit device realizing improved detection of a failure while suppressing deterioration in performance. In a semiconductor integrated circuit device executing a plurality of threads while switching them synchronously with clocks, registers used for executing the threads are provided for the respective threads. Programs independent of each other and the same program as the threads are executed while being switched. In the case of executing the same program by a plurality of threads, a comparison circuit for comparing results of execution using registers provided in correspondence with the threads is provided.


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