The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2015
Filed:
Mar. 27, 2014
Emc Corporation, Hopkinton, MA (US);
Helen S. Raizen, Jamaica Plain, MA (US);
Ajith Balakrishnan, Karanataka, IN;
EMC Corporation, Hopkinton, MA (US);
Abstract
Described are techniques for parameter selection. First processing is performed that migrates data of a first device from an origin to a destination data storage system. The first processing includes cutover processing. After cutover processing is performed, requests to the first device are serviced by the destination data storage system rather than the origin data storage system. During first processing, occurrence of cutover processing is detected. Responsive to detecting the occurrence of cutover processing, second processing is performed to update one or more parameters each having a value that varies in accordance with a type of physical data storage system. Prior to second processing, the parameters have values determined in accordance with a type of physical data storage system of the origin data storage system, and after second processing, the parameters have values determined in accordance with a type of physical data storage system of the destination data storage system.