The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2015

Filed:

Jan. 17, 2012
Applicants:

Masato Nakagawa, Kyoto, JP;

Hirotada Watanabe, Yokohama, JP;

Yoichi Wada, Kawasaki, JP;

Inventors:

Masato Nakagawa, Kyoto, JP;

Hirotada Watanabe, Yokohama, JP;

Yoichi Wada, Kawasaki, JP;

Assignees:

NIKON CORPORATION, Tokyo, JP;

KYOTO UNIVERSITY, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G02B 21/36 (2006.01); C12M 1/00 (2006.01); C12M 1/34 (2006.01); C12M 1/36 (2006.01); G02B 21/14 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); C12M 41/14 (2013.01); C12M 41/36 (2013.01); C12M 41/48 (2013.01); G02B 21/14 (2013.01);
Abstract

An image processing apparatus includes an outline extracting processing unit inputting a phase contrast image of a cell colony acquired by an observing unit, and extracting an outline of the cell colony, an extracting unit extracting a feature quantity of an outline part of the cell colony based on brightness information at an outside and brightness information at an inside of the outline on the phase contrast image, and an automatic discriminating unit automatically discriminating whether or not the cell colony is an iPS cell colony based on a discriminant criterion determined in advance and the feature quantity extracted by the extracting unit.


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