The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2015
Filed:
Jul. 26, 2013
Ecolab Usa Inc., Naperville, IL (US);
Prasad Y. Duggirala, Naperville, IL (US);
Sergey M. Shevchenko, Aurora, IL (US);
Michael J. Murcia, DeKalb, IL (US);
ECOLAB USA INC., Naperville, IL (US);
Abstract
The invention provides methods and compositions for measuring the formation of scale within a process system. The method involves measuring changes in the cell fouling as reflected on the refraction index measurements of a liquid medium with a refractometer and determining the scale formation from changes in the cell fouling factor. This allows for a refractometer to determine the formation of scale in locations that otherwise would not be measurable.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile