The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2015
Filed:
Jun. 22, 2012
Takashi Kondo, Nagaokakyo, JP;
Kazuhiro Takigawa, Nagaokakyo, JP;
Seiji Kamba, Nagaokakyo, JP;
Ryoichi Fukasawa, Ohtawara, JP;
Tomofumi Ikari, Ohtawara, JP;
Takashi Kondo, Nagaokakyo, JP;
Kazuhiro Takigawa, Nagaokakyo, JP;
Seiji Kamba, Nagaokakyo, JP;
Ryoichi Fukasawa, Ohtawara, JP;
Tomofumi Ikari, Ohtawara, JP;
MURATA MANUFACTURING CO., LTD, Nagaokakyo-Shi, Kyoto-Fu, JP;
Abstract
A measuring method for measuring characteristics of an object to be measured, the measuring method including holding the object on a void-arranged structure having at least two void portions that pass therethrough in a direction perpendicular to a principal surface thereof, and applying electromagnetic waves to the void-arranged structure on which the object is held to detect frequency characteristics of the electromagnetic waves transmitted through the void-arranged structure. The void-arranged structure has a grid structure in which the void portions are periodically arranged in at least one direction on the principal surface of the void-arranged structure. The characteristics of the object are measured on the basis of a relationship between a first frequency characteristic and a second frequency characteristic.