The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2015

Filed:

Oct. 14, 2011
Applicants:

Lori J. Peterson, Los Alamos, NM (US);

Cameron A. Mortillaro, Sante Fe, NM (US);

Benjamin P. Warner, Los Alamos, NM (US);

Nathan H. Zahler, Los Alamos, NM (US);

Pratima Bharti, Chandigarh, IN;

Chang-tai Hsieh, Los Alamos, NM (US);

Emilia A. Solomon, Los Alamos, NM (US);

Inventors:

Lori J. Peterson, Los Alamos, NM (US);

Cameron A. Mortillaro, Sante Fe, NM (US);

Benjamin P. Warner, Los Alamos, NM (US);

Nathan H. Zahler, Los Alamos, NM (US);

Pratima Bharti, Chandigarh, IN;

Chang-Tai Hsieh, Los Alamos, NM (US);

Emilia A. Solomon, Los Alamos, NM (US);

Assignee:

XRpro Sciences, Inc., Los Alamos, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/223 (2013.01); A61B 6/485 (2013.01); G01N 2223/0766 (2013.01); G01N 2223/076 (2013.01);
Abstract

The present invention is a method to quantify biomarkers. The method uses an X-ray fluorescence spectrometer to perform an X-ray fluorescence analysis on the sample to obtain spectral features derived from the biomarker; and quantifying the X-ray fluorescence signal of the biomarker.


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