The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2015
Filed:
Jun. 20, 2011
Applicant:
Paul Evans, Nottingham, GB;
Inventor:
Paul Evans, Nottingham, GB;
Assignee:
The Nottingham Trent University, Nottingham, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/201 (2006.01); G01N 23/083 (2006.01); G06K 9/46 (2006.01); G06K 9/60 (2006.01); G01N 23/20 (2006.01); G06T 7/00 (2006.01); G01V 5/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/20083 (2013.01); G01N 23/083 (2013.01); G01V 5/0033 (2013.01); G01N 23/201 (2013.01); G06T 7/0002 (2013.01); G06T 2207/10116 (2013.01);
Abstract
A method of sample analysis comprises irradiating a sample with electromagnetic radiation such as X-rays; collecting absorption data and scattering data; and combining the absorption and scattering data. The irradiation can be in the form of a tubular beam, a detector may be placed in a plane where Debye cones diffracted from the sample overlap at a central point for the collection of the scattering data.