The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2015

Filed:

Jan. 30, 2013
Applicant:

Murata Manufacturing Co., Ltd., Nagaokakyo, Kyoto-fu, JP;

Inventors:

Megumi Fukuda, Nagaokakyo, JP;

Takayuki Yao, Nagaokakyo, JP;

Assignee:

MURATA MANUFACTURING CO., LTD., Nagaokakyo-Shi, Kyoto-Fu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01G 4/06 (2006.01); C04B 35/00 (2006.01); C04B 35/46 (2006.01); C04B 35/468 (2006.01); H01B 3/12 (2006.01); H01G 4/12 (2006.01); H01G 4/30 (2006.01); B32B 18/00 (2006.01); C01G 23/00 (2006.01); C04B 35/626 (2006.01); C04B 35/638 (2006.01); C01G 37/14 (2006.01); C01G 45/12 (2006.01); B82Y 30/00 (2011.01);
U.S. Cl.
CPC ...
C04B 35/46 (2013.01); Y10T 29/435 (2015.01); C04B 35/4682 (2013.01); C04B 2235/3206 (2013.01); C04B 2235/3215 (2013.01); C04B 2235/3224 (2013.01); C04B 2235/3232 (2013.01); C04B 2235/3262 (2013.01); H01B 3/12 (2013.01); H01G 4/1227 (2013.01); H01G 4/30 (2013.01); H01G 4/1209 (2013.01); B32B 18/00 (2013.01); C01G 23/003 (2013.01); C04B 35/6261 (2013.01); C04B 35/62675 (2013.01); C04B 35/638 (2013.01); C04B 2235/3208 (2013.01); C04B 2235/3217 (2013.01); C04B 2235/3225 (2013.01); C04B 2235/3227 (2013.01); C04B 2235/3229 (2013.01); C04B 2235/3241 (2013.01); C04B 2235/3284 (2013.01); C04B 2235/3418 (2013.01); C04B 2235/44 (2013.01); C04B 2235/5454 (2013.01); C04B 2235/6584 (2013.01); C04B 2235/72 (2013.01); C04B 2235/781 (2013.01); C04B 2235/785 (2013.01); C04B 2237/346 (2013.01); C04B 2237/704 (2013.01); C01G 37/14 (2013.01); C01G 45/1264 (2013.01); C01P 2004/62 (2013.01); C01P 2004/64 (2013.01); B82Y 30/00 (2013.01);
Abstract

Provided is a laminated ceramic capacitor which produces excellent lifetime characteristics in a high-temperature loading test even when dielectric layers are reduced in thickness. The dielectric ceramic contains, as its main constituent, a compound represented by the general formula (BaCaRe)(TiM)O(where Re is at least one or more elements selected from among La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, and Y, and M is at least one or more elements selected from among Mg, Mn, Al, Cr, and Zn), 0≦x≦0.2, 0.002≦y≦0.1, and 0.001≦z≦0.05. This dielectric ceramic has crystal grains of 20 nm or more and 150 nm or less in average grain size.


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