The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2015
Filed:
Mar. 04, 2011
Gunter Schneider, Marburg, DE;
Torsten Gerrath, Marburg, DE;
Gunter Schneider, Marburg, DE;
Torsten Gerrath, Marburg, DE;
SCHNEIDER GMBH & CO. KG, Fronhausen, DE;
Abstract
A method for calibrating a miffing, cutting or grinding tool of a spectacle lens frame machining unit, for which a) in a first machining step, prior to shaping an edge or surface shape RF by the milling, cutting or grinding tool, the lens is measured by an optical measuring device, b) the shaping of an edge or surface shape RF is carried out by the milling, cutting or grinding tool, c) the generated edge or surface shape RF is measured by the optical measuring device, d) a deviation between the surface or edge shape RF so produced and the desired surface or edge shape target values is determined, and e) the tool is calibrated at least by adjusting the control variables. The invention further relates to a device for the initial working of edges, chamfers and/or grooves at the edges of lenses, wherein an optical measuring system for measuring surface or edge shapes RF and/or edges K of the lens prior to and/or after machining the lens is provided.