The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2015

Filed:

Nov. 23, 2011
Applicant:

Teruhisa Tsuru, Kyoto-Fu, JP;

Inventor:

Teruhisa Tsuru, Kyoto-Fu, JP;

Assignee:

MURATA MANUFACTURING CO., LTD., Nagaokakyo-Shi, Kyoto-Fu, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); B07C 5/00 (2006.01);
U.S. Cl.
CPC ...
B07C 5/00 (2013.01);
Abstract

A product discriminating device that includes a measuring section, a discriminating unit, a deemed standard deviation calculation unit, a re-discriminating unit, a rank estimated number calculation unit, and a standard deviation calculation unit. The standard deviation calculation unit changes variables of a probability distribution of a deemed standard deviation such that the number of products belonging to at least one of a predetermined plurality of ranks re-discriminated at least once and an estimated number of the products belonging to the rank in a rank estimated number calculation unit substantially match each other, and calculates the changed variables as a standard deviation of characteristic value variation of the products and a standard deviation of measurement value variation.


Find Patent Forward Citations

Loading…