The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2015

Filed:

Oct. 15, 2010
Applicants:

Ayumi Sato, Shizuoka, JP;

Tsuyoshi Harada, Tokyo, JP;

Takashi Yano, Shizuoka, JP;

Yoko Wakabayashi, Tokyo, JP;

Inventors:

Ayumi Sato, Shizuoka, JP;

Tsuyoshi Harada, Tokyo, JP;

Takashi Yano, Shizuoka, JP;

Yoko Wakabayashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/53 (2006.01); A61K 31/202 (2006.01); G01N 33/576 (2006.01); G01N 33/68 (2006.01);
U.S. Cl.
CPC ...
A61K 31/202 (2013.01); G01N 33/576 (2013.01); G01N 33/6893 (2013.01); G01N 2800/044 (2013.01); G01N 2800/52 (2013.01); G01N 2800/56 (2013.01); G01N 2800/60 (2013.01);
Abstract

Disclosed is a novel NASH marker for use in a method for detecting NASH or evaluating the severity of NASH, which utilizes at least one factor selected from the group consisting of an IL-1 receptor antagonist, sCD40, HMGB1, sPLA2 group IIA and an sPLA2 activity as the marker. Also disclosed is a method for detecting NASH or evaluating the severity of NASH in a subject, which utilizes the marker.


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