The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2015

Filed:

Dec. 05, 2013
Applicant:

Korea Basic Science Institute, Daejeon, KR;

Inventors:

Mo Yang, Daejeon, KR;

Seung Yong Kim, Daejeon, KR;

Hyun Sik Kim, Daejeon, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/42 (2006.01); H01J 49/06 (2006.01);
U.S. Cl.
CPC ...
H01J 49/065 (2013.01); Y10T 29/49826 (2015.01); H01J 49/424 (2013.01); H01J 49/421 (2013.01);
Abstract

An ion trap mass spectrometer is provided, including: an electron emitter; an ion trap storing ions generated by ionization resulting from an impact with electrons emitted from the electron emitter; a secondary ion filter for blocking out secondary ions generated due to ions selectively released by the ion trap; and a detector detecting ions selectively released from the ion trap, wherein the electron emitter, the ion trap, the secondary ion filter, and the ion detector are arranged on the same axis, so that a pure mass spectrum can be measured by excluding the secondary ions which are causes of background noise signals in the procedure of detection of the ions by the ion trap mass spectrometer.


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