The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2015

Filed:

Oct. 07, 2013
Applicant:

Rapiscan Systems, Inc., Torrance, CA (US);

Inventor:

Joseph W. Kaminski, Campbell, CA (US);

Assignee:

Rapiscan Systems, Inc., Torrance, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 1/04 (2006.01);
U.S. Cl.
CPC ...
G21K 1/043 (2013.01); G21K 1/046 (2013.01);
Abstract

The present specification discloses a beam chopping apparatus, and more specifically, a helical shutter for an electron beam system that is employed in radiation-based scanning systems, and more specifically, a beam chopping apparatus that allows for variability in both velocity and beam spot size by modifying the physical characteristics or geometry of the beam chopper apparatus. The present specification also discloses a beam chopping apparatus which provides a vertically moving beam spot with substantially constant size and velocity to allow for substantially equal illumination of the target. In addition, the present specification is a beam chopping apparatus that is lightweight and does not cause an X-ray source assembly employing the beam chopper to become heavy and difficult to deploy.


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