The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2015

Filed:

Jun. 30, 2010
Applicants:

Florian Moliere, Paris, FR;

Bruno Foucher, Chatillon Sous Bagneux, FR;

Inventors:

Florian Moliere, Paris, FR;

Bruno Foucher, Chatillon Sous Bagneux, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G06Q 10/06 (2012.01); G06F 17/50 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G06Q 10/06 (2013.01); G06F 17/5036 (2013.01); G06F 17/5081 (2013.01); G06F 2217/82 (2013.01); G01R 31/2855 (2013.01);
Abstract

A method for estimating the lifetime of a deep-submicron-generation integrated electronic component, linked to a wear mechanism occurring in previously defined special conditions of use, said component being of a deep submicron type, with very large-scale integration, commercially available off the shelf, wherein one assumes that the same sample population always experiences a failure due to: the most predominant failure mechanism, during the period of useful life, described by an exponential law, and the most critical wear mechanism, represented by a Weibull distribution at the end of the previous period.


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