The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2015

Filed:

Sep. 21, 2012
Applicant:

Fondation DE L'institut DE Recherche Idiap, Martigny, CH;

Inventors:

Charles Dubout, Renens, CH;

Francois Fleuret, Yverdon-les-Bains, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G06K 9/52 (2006.01); G06F 17/14 (2006.01);
U.S. Cl.
CPC ...
G06K 9/522 (2013.01); G06F 17/142 (2013.01);
Abstract

Object detection receives an input image to detect an object of interest. It determines feature matrices based on the received image, wherein each matrix represents a feature of the received image. The plurality of matrices are Fourier transformed to Fourier feature matrices. Fourier filter matrices are provided, each representing a feature of an object transformed in Fourier space. Each filter matrix is point-wise multiplied with one of the feature matrices corresponding to the same feature. The plurality of matrices are summed, resulting by point-wise multiplying each Fourier filter matrix with the corresponding Fourier feature matrix to obtain a Fourier score matrix. An inverse Fourier transform of the Fourier score matrix is performed, resulting in a score matrix, which is used to detect the object in the input image.


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