The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2015

Filed:

Sep. 30, 2008
Applicant:

Mazda A. Marvasti, Rancho Santa Margarita, CA (US);

Inventor:

Mazda A. Marvasti, Rancho Santa Margarita, CA (US);

Assignee:

VMware, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); H04L 12/24 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0751 (2013.01); G06F 11/0709 (2013.01); H04L 41/0681 (2013.01); H04L 41/147 (2013.01); H04L 43/16 (2013.01);
Abstract

A system and method are provided for determining problem conditions in an IT infrastructure using aggregate anomaly analysis. The anomalies in the metrics occurring in the monitored IT infrastructure are aggregated from all resources reporting metrics as a function of time. The aggregated metric anomalies are then normalized to account for the state of the monitored IT infrastructure to provide a normalized aggregate anomaly count. A threshold noise level is then determined utilizing a variably selectable desired level of confidence such that a problem event is only determined to likely be occurring in the IT infrastructure when the normalized aggregate anomaly count exceeds the threshold noise level. The normalized aggregate anomaly count is monitored against the threshold noise level as a function of time, such that a problem event in the IT infrastructure is identified when the normalized aggregate anomaly count exceeds the threshold noise level at a given time.


Find Patent Forward Citations

Loading…