The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2015
Filed:
Sep. 07, 2010
Michael Stewart Griffith, Chelmsford, GB;
Imdad Sajjad Badruddin Sardharwalla, Chelmsford, GB;
Michael Stewart Griffith, Chelmsford, GB;
Imdad Sajjad Badruddin Sardharwalla, Chelmsford, GB;
BAE SYSTEMS plc, London, GB;
Abstract
A method and apparatus for compensating for hysteresis in a system, the method comprising: determining a first estimate of a system parameter using the Preisach model; measuring a value of a system parameter; and determining an updated estimate of the estimated system parameter using the measured value of a system parameter. The measured system parameter may be the same system parameter as the system parameter for which the first estimate is determined using the Preisach model, or it may be a further system parameter that is a different system parameter to the system parameter for which the first estimate is determined using the Preisach model. Determining the updated estimate of the estimated system parameter may further use the first estimate of the estimated system parameter, or it may further use a corresponding determined value of the further system parameter.