The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2015

Filed:

Apr. 30, 2013
Applicant:

Schlumberger Technology Corporation, Sugar Land, TX (US);

Inventors:

Dzevat Omeragic, Lexington, MA (US);

Keli Sun, Sugar Land, TX (US);

Qiming Li, Sugar Land, TX (US);

Tarek M. Habashy, Burlington, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/26 (2006.01); G01V 3/40 (2006.01); G01V 3/20 (2006.01); G01V 3/28 (2006.01);
U.S. Cl.
CPC ...
G01V 3/20 (2013.01); G01V 3/28 (2013.01);
Abstract

A multi-step electromagnetic inversion method is provided for determining formation resistivity, anisotropy and dip. An electromagnetic logging tool is used to obtain non-directional, anisotropy, and directional (including symmetrized and anti-symmetrized resistivity measurements) in a formation using an electromagnetic logging tool. Bed boundaries of the formation are first identified. A horizontal resistivity profile is obtained using the non-directional resistivity measurements, and a vertical resistivity profile is obtained using the anisotropy resistivity measurements. The vertical resistivity profile is improved using the directional resistivity measurements, while dip values are also obtained via an inversion using the directional resistivity measurements. Then, an inversion for each of vertical resistivity, horizontal resistivity, dip values, and bed boundaries is performed using all of the non-directional, anisotropy, and directional resistivity measurements to obtain a formation model.


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