The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2015
Filed:
Nov. 17, 2011
James W. Fonda, Moscow Mills, MO (US);
Christopher S. Huskamp, St. Louis, MO (US);
James W. Fonda, Moscow Mills, MO (US);
Christopher S. Huskamp, St. Louis, MO (US);
The Boeing Company, Chicago, IL (US);
Abstract
A non-destructive inspection apparatus, system and associated method are provided to facilitate the inspection of a workpiece. The non-destructive inspection apparatus includes an ultrasonic sensor configured to be placed in operable contact with the workpiece. The ultrasonic sensor is configured to emit ultrasonic signals into the workpiece and to receive return signals from the workpiece. The non-destructive inspection apparatus also includes a grip operably connected to the ultrasonic sensor such that the grip and the ultrasonic sensor are movable in concert. The grip is configured to support an operator's palm, such as a majority of the operator's palm, such that force applied to the ultrasonic inspection apparatus by the operator is transferred via the grip to the ultrasonic sensor. The non-destructive inspection system may also include a computer in communication with the non-destructive inspection apparatus to receive information relating to the return signals received by the ultrasonic sensor.