The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2015
Filed:
Nov. 15, 2013
Alastair A. Macdowell, Berkeley, CA (US);
James Nasiatka, San Francisco, CA (US);
Abdel Haboub, Richmond, CA (US);
Robert O. Ritchie, Berkeley, CA (US);
Hrishikesh A. Bale, Walnut Creek, CA (US);
Alastair A. MacDowell, Berkeley, CA (US);
James Nasiatka, San Francisco, CA (US);
Abdel Haboub, Richmond, CA (US);
Robert O. Ritchie, Berkeley, CA (US);
Hrishikesh A. Bale, Walnut Creek, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
This disclosure provides systems, methods, and apparatus related to the high temperature mechanical testing of materials. In one aspect, a method includes providing an apparatus. The apparatus may include a chamber. The chamber may comprise a top portion and a bottom portion, with the top portion and the bottom portion each joined to a window material. A first cooled fixture and a second cooled fixture may be mounted to the chamber and configured to hold the sample in the chamber. A plurality of heating lamps may be mounted to the chamber and positioned to heat the sample. The sample may be placed in the first and the second cooled fixtures. The sample may be heated to a specific temperature using the heating lamps. Radiation may be directed though the window material, the radiation thereafter interacting with the sample and exiting the chamber through the window material.