The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2015
Filed:
Nov. 16, 2012
Samsung Electronics Co., Ltd., Suwon-si, KR;
Jae Hak Lee, Yongin-si, KR;
Jong Ha Lee, Hwaseong-si, KR;
Sung Cheol Kim, Goyang-si, KR;
Young Hun Sung, Hwaseong-si, KR;
Kang Eui Lee, Yongin-si, KR;
Kwang Eun Jang, Busan, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
An image reconstruction system, apparatus, and method employing a non-sequential scanning scheme using real-time feedback are provided. A projection information generating unit is configured to generate at least one piece of projection information by the X-ray irradiated to the object in the at least one viewpoint. A projection information comparing unit is configured to compare predicted intermediate projection information with measured intermediate projection information from the generated projection information. The predicted intermediate projection information is predicted from pieces of projection information generated from different viewpoints, and the measured intermediate projection information is measured in an intermediate viewpoint corresponding to the predicted intermediate projection information. A determining unit is configured to determine whether to irradiate the X-ray to the object in an additional viewpoint. An image reconstructing unit is configured to reconstruct the generated projection information, and to acquire an image representing the object.